| US 7,463,039 B2 | ||
| Probe for electrical measurement methods, especially eddy current measurements | ||
| Ludwig Bär, Erlangen (Germany); and Werner Heinrich, Bärenklau (Germany) | ||
| Assigned to Siemens Aktiengesellschaft, Munich (Germany) | ||
| Appl. No. 10/563,947 PCT Filed Jun. 23, 2004, PCT No. PCT/EP2004/006792 § 371(c)(1), (2), (4) Date Jun. 27, 2006, PCT Pub. No. WO2005/005976, PCT Pub. Date Jan. 20, 2005. |
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| Claims priority of application No. 03015494 (EP), filed on Jul. 09, 2003. | ||
| Prior Publication US 2007/0182422 A1, Aug. 09, 2007 | ||
| This patent is subject to a terminal disclaimer. | ||
| Int. Cl. G01R 27/26 (2006.01); G01N 27/72 (2006.01) | ||
| U.S. Cl. 324—600 [324/696; 324/220] | 11 Claims |
| 1. An eddy current probe for electrical measurement methods, comprising:
a substrate with a resting surface and the resting surface comes to lie on a test piece;
two electrical components mounted on the substrate such that the probe with the substrate is flexible and the probe with the
substrate adapts itself to a different radii of curvature of the test piece;
a backing with a ferritic and/or magnetic material that at least partly covers at least one electrical component and is formed
elastically;
an exciter coil as a first electrical component; and
a signal coil as the second electrical component,
wherein the exciter coil encloses a coil section of the signal coil and the signal coil and the exciter winding lie in one
plane or on a surface of the substrate.
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