| US 7,462,821 B2 | ||
| Instrumentation, articles of manufacture, and analysis methods | ||
| Dennis Barket, Jr., Lafayette, Ind. (US); and J. Mitchell Wells, Lafayette, Ind. (US) | ||
| Assigned to Griffin Analytical Technologies, L.L.C., West Lafayette, Ind. (US) | ||
| Appl. No. 10/554,039 PCT Filed Apr. 26, 2004, PCT No. PCT/US2004/012849 § 371(c)(1), (2), (4) Date Oct. 20, 2005, PCT Pub. No. WO2004/097352, PCT Pub. Date Nov. 11, 2004. |
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| Claims priority of provisional application 60/465367, filed on Apr. 25, 2003. | ||
| Prior Publication US 2006/0243901 A1, Nov. 02, 2006 | ||
| Int. Cl. B01D 59/44 (2006.01) | ||
| U.S. Cl. 250—288 [250/282; 250/281] | 36 Claims |
| 1. An instrument comprising:
an ionization source configured to apply different ionization energies to a sample to provide different sample characteristics;
processing circuitry configured to process the different sample characteristics to identify the sample;
wherein the processing circuitry is configured to acquire at least two data sets of the different sample characteristics,
one of the two data sets of the different sample characteristics comprising a first sample characteristic associated with
a first ionization energy and another of the two data sets of the different sample characteristics comprising a second sample
characteristic associated with a second ionization energy; and
wherein the processing circuitry is further configured to access at least two data sets of reference sample characteristics,
one of the data sets of the reference sample characteristics comprising a third reference sample characteristic associated
with the first ionization energy and another of the two data sets of the reference sample characteristics comprising a fourth
reference sample characteristic associated with the second ionization energy.
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