US 7,461,464 B2
Position measuring arrangement
Rudolf Mittmann, Tacherting (Germany); and Erich Strasser, Trostberg (Germany)
Assigned to Johannes Heidenhain, GmbH, Traunreut (Germany)
Filed on Feb. 09, 2007, as Appl. No. 11/704,511.
Claims priority of application No. 10 2006 007 184 (DE), filed on Feb. 15, 2006.
Prior Publication US 2007/0186431 A1, Aug. 16, 2007
Int. Cl. G01D 5/244 (2006.01); G01D 5/347 (2006.01)
U.S. Cl. 33—706  [33/707; 702/94] 17 Claims
OG exemplary drawing
 
1. A position measuring arrangement, comprising:
an arrangement of scanning elements for scanning an absolute code;
a selection system for selecting scanning signals from said arrangement of scanning elements by a first method of selection and a second method of selection different from said first method of selection; and
a decoding device for forming a first absolute measured position value from said scanning signals selected by said selection system when said first method of selection is applied to said selection system and a second absolute measured position value from said scanning signals selected by said selection system when said second method of selection is applied.