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| Class 324 | ELECTRICITY: MEASURING AND TESTING |
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![[List of Pre Grant Publications for class 324 subclass 300]](../as.gif) | ![[List of Patents for class 324 subclass 300]](../ps.gif) | 300 | PARTICLE PRECESSION RESONANCE |
| | 301 |  Using a magnetometer |
| | 303 | Using well logging device |
| | 304 | Using optical pumping or sensing device |
| | 306 | Determine fluid flow rate |
| | 307 | Using a nuclear resonance spectrometer system |
| | 308 |  Including a test sample and control sample |
| | 309 | To obtain localized resonance within a sample |
| | 310 | By scanning sample frequency spectrum |
| | 311 | With signal decoupling |
| | 312 | By spectrum storage and analysis |
| | 313 | Including polarizing magnetic field/radio frequency tuning |
| | 314 | With conditioning of transmitter signal |
| | 315 | With sample resonant frequency and temperature interdependence |
| | 316 | Using an electron resonance spectrometer system |
| | 318 | Spectrometer components |
| | 323 | OF GEOPHYSICAL SURFACE OR SUBSURFACE IN SITU |
| | 324 | Including borehole fluid investigation |
| | 326 | For small object detection or location |
| | 330 | By aerial survey |
| | 332 | With radiant energy or nonconductive-type transmitter |
| | 344 | With radiant energy or nonconductive-type receiver |
| | 345 | By magnetic means |
| | 347 | Using electrode arrays, circuits, structure, or supports |
| | 348 | For detecting naturally occurring fields, currents, or potentials |
| | 354 | Coupled to artificial current source |
| | 376 | OF SUBSURFACE CORE SAMPLE |
| | 378 | INTERNAL-COMBUSTION ENGINE IGNITION SYSTEM OR DEVICE |
| | 379 | With analysis of displayed waveform |
| | 380 | Electronic ignition system |
| | 383 | By simulating or substituting for a component under test |
| | 384 | Using plural tests in a conventional ignition system |
| | 385 | Distributor |
| | 388 | Coil |
| | 389 | Magneto |
| | 390 | Low or high tension lead |
| | 391 | Ignition timing |
| | 393 | In situ testing of spark plug |
| | 394 | With cathode-ray tube display |
| | 395 | Using an illuminating device to indicate spark plug condition |
| | 396 | With an air gap in series with spark plug to indicate spark plug condition |
| | 397 | By shorting the plug to ground to indicate spark plug condition |
| | 399 | Wherein a measured electric quantity indicates spark plug condition |
| | 400 | Spark plug removed or tested in a test fixture |
| | 402 | Apparatus for coupling a measuring instrument to an ignition system |
| | 403 | ELECTRIC LAMP OR DISCHARGE DEVICE |
| | 404 | Cathode-ray tube |
| | 405 | Vacuum tube |
| | 406 | Plural tubes in the testing circuit |
| | 407 | Testing circuit for diverse-type tube |
| | 408 | Circuit for making diverse test |
| | 409 | Testing discharge space characteristic (e.g., emission) |
| | 413 | Shock testing |
| | 414 | Electric lamp |
| | 415 | ELECTROMECHANICAL SWITCHING DEVICE |
| | 416 | Voltage regulator |
| | 417 | Thermostat switch |
| | 418 | Relay |
| | 419 | Reed switch |
| | 420 | To evaluate contact chatter |
| | 421 | To evaluate contact resistance |
| | 422 | To evaluate contact sequence of operation |
| | 423 | To evaluate contact response time |
| | 424 | Circuit breaker |
| | 425 | ELECTROLYTE PROPERTIES |
| | 426 | Using a battery testing device |
| | 427 | To determine ampere-hour charge capacity |
| | 429 | To determine load/no-load voltage |
| | 430 | To determine internal battery impedance |
| | 431 | With temperature compensation of measured condition |
| | 432 | To determine battery electrolyte condition |
| | 433 | To compare battery voltage with a reference voltage |
| | 434 | To determine plural cell condition |
| | 435 | Having particular meter scale or indicator |
| | 436 | Including oscillator in measurement circuit |
| | 437 | Including probe structure |
| | 438 | Using a pH determining device |
| | 439 | Using a conductivity determining device |
| | 440 | Which includes a dropping mercury cell |
| | 441 | Which includes a temperature responsive element |
| | 442 | Which includes an oscillator |
| | 443 | Having a bridge circuit |
| | 444 | Which includes current and voltage electrodes |
| | 445 | Having inductance probe structure |
| | 446 | Having conductance probe structure |
| | 447 |  With movable or adjustable electrode |
| | 448 | With concentric electrodes |
| | 449 | With axially arranged electrodes |
| | 450 | Which includes particular cell container structure |
| | 451 | A MATERIAL PROPERTY USING THERMOELECTRIC PHENOMENON |
| | 452 | A MATERIAL PROPERTY USING ELECTROSTATIC PHENOMENON |
| | 457 | ELECTROSTATIC FIELD |
| | 459 | USING IONIZATION EFFECTS |
| | 200 | MAGNETIC |
| | 201 | Susceptibility |
| | 202 | Calibration |
| | 203 | Curie point determination |
| | 204 | Fluid material examination |
| | 205 | Permanent magnet testing |
| | 206 | Movable random length material measurement |
| | 207.11 | Displacement |
| | 207.12 | Compensation for measurement |
| | 207.13 | Having particular sensor means |
| | 207.14 | Diverse sensors |
| | 207.15 | Inductive |
| | 207.2 | Hall effect |
| | 207.21 | Magnetoresistive |
| | 207.22 | Having particular sensed object |
| | 207.23 | Plural measurements (e.g., linear and rotary) |
| | 207.24 | Linear |
| | 207.25 | Rotary |
| | 207.26 | Approach or retreat |
| | 209 | Stress in material measurement |
| | 210 | Magnetic information storage element testing |
| | 213 | Magnetic recording medium on magnetized object records object field |
| | 214 | By paramagnetic particles |
| | 217 | Railroad rail flaw testing |
| | 219 | Magnetic sensor within material |
| | 222 | Hysteresis or eddy current loss testing |
| | 223 | Hysteresis loop curve display or recording |
| | 224 | With temperature control of material or element of test circuit |
| | 225 | With compensation for test variable |
| | 226 | Combined |
| | 227 | Plural tests |
| | 228 | With means to create magnetic field to test material |
| | 229 | Thickness measuring |
| | 232 | Plural magnetic fields in material |
| | 233 | With phase sensitive element |
| | 234 | Electrically energized nonforce type sensor |
| | 239 | Induced voltage-type sensor |
| | 244 | Magnetometers |
| | 244.1 | Optical |
| | 245 | Plural sensor axis misalignment correction |
| | 246 | With means to align field sensor with magnetic field sensed |
| | 247 | Nonparallel plural magnetic sensors |
| | 248 | Superconductive magnetometers |
| | 249 | Thin film magnetometers |
| | 250 | Electronic tube or microwave magnetometers |
| | 251 | Hall plate magnetometers |
| | 252 | Semiconductor type solid-state or magnetoresistive magnetometers |
| | 253 | Saturable core magnetometers |
| | 256 | Energized movable sensing coil magnetometers |
| | 257 | Moving coil magnetometer |
| | 258 | Fixed coil magnetometer |
| | 259 | Movable magnet or magnetic member interacts with magnetic field |
| | 260 | Magnetic field detection devices |
| | 262 | Magnetic test structure elements |
| | 263 | Current through test material forms test magnetic field |
| | 500 | FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS |
| | 501 | Using radiant energy |
| | 502 | In an ignitor or detonator |
| | 503 | In vehicle wiring |
| | 506 | Combined with a flashlight |
| | 508 | With electric power receptacle for line wire testing |
| | 509 | Of ground fault indication |
| | 511 | Of electrically operated apparatus (power tool, appliance, machine, etc.) |
| | 512 | For fault location |
| | 513 | Where component moves while under test |
| | 514 | By exposing component to liquid or gas while under test |
| | 515 | Using a particular sensing electrode |
| | 519 | By capacitance measuring |
| | 520 | By frequency sensitive or responsive detection |
| | 521 | By phase sensitive or responsive detection |
| | 522 | By voltage or current measuring |
| | 525 | By resistance or impedance measuring |
| | 527 | By applying a test signal |
| | 534 | By reflection technique |
| | 535 | By time measuring |
| | 536 | By spark or arc discharge |
| | 537 | Of individual circuit component or element |
| | 750.01 | Measurement or control of test condition |
| | 750.14 | Environmental control |
| | 750.15 | With identification on device under test (DUT) |
| | 750.16 | Relative positioning or alignment of device under test and test structure |
| | 750.17 | By capacitive means |
| | 750.18 | By information on device under test |
| | 750.19 | Adjustable support for device under test |
| | 750.22 | Testing device mounted for multi-directional movement |
| | 750.23 | Using optical means |
| | 750.24 | By electrical contact means |
| | 750.25 | By mechanical means |
| | 750.26 | Shielding or casing of device under test or of test structure |
| | 750.3 | Built-in test circuit |
| | 754.01 | Test probe techniques |
| | 754.02 | Hand-held |
| | 754.03 | Contact probe |
| | 754.04 |  Liquid state |
| | 754.05 | Kelvin probe |
| | 754.06 | Waveguide probe |
| | 754.07 | Probe or probe card with build-in circuit element |
| | 754.08 | In or on support for device under test |
| | 754.1 | Probe contact confirmation |
| | 754.11 | Probe contact enhancement or compensation |
| | 754.12 | Biasing means |
| | 754.18 | With interpose |
| | 754.19 | With recording of test result |
| | 754.2 | Penetrative |
| | 754.21 | Non-contact probe |
| | 755.01 | Probe structure |
| | 755.02 | Coaxial |
| | 755.03 | Rigid |
| | 755.04 | Force absorption |
| | 755.07 | Cantilever |
| | 755.08 | Elastomeric |
| | 755.09 | Membrane |
| | 755.1 | Dendritic structure |
| | 755.11 | Elongated pin or probe |
| | 756.01 | Support for device under test or test structure |
| | 756.02 | DUT socket or carrier |
| | 756.03 | Probe card |
| | 756.04 | Pin fixture |
| | 756.05 | With electrical connectors |
| | 756.06 | With impedance matching |
| | 756.07 | Board or plate |
| | 757.01 | Transporting or conveying the device under test to the testing station |
| | 757.02 | Printed circuit board |
| | 757.03 | Wafer |
| | 757.04 | Packaged IC or unpackaged die or dice |
| | 757.05 | Multiple chip module |
| | 758.01 | Cleaning probe or device under test |
| | 759.01 | After-test activity |
| | 760.01 | Test of liquid crystal device |
| | 761.01 | Test of solar cell |
| | 762.01 | Test of semiconductor device |
| | 762.02 | Packaged integrated circuits |
| | 762.03 | Integrated circuit die |
| | 762.05 | Semiconductor wafer |
| | 762.06 | Multiple chip module |
| | 762.07 | Diode |
| | 762.08 | Bipolar transistor |
| | 762.09 | Field effect transistor |
| | 762.1 | With barrier layer |
| | 763.01 | Printed circuit board |
| | 764.01 | Power supply |
| | 765.01 | Motor or generator fault |
| | 538 | Electrical connectors |
| | 539 | Multiconductor cable |
| | 543 | Single conductor cable |
| | 545 | Armature or rotor |
| | 546 | Winding or coil |
| | 548 | Capacitor |
| | 549 | Resistor |
| | 550 | Fuse |
| | 551 | Insulation |
| | 555 | Instruments and devices for fault testing |
| | 557 | FOR INSULATION FAULT OF NONCIRCUIT ELEMENTS |
| | 558 | Where element moves while under test |
| | 559 | Where a moving sensing electrode scans a stationary element under test |
| | 600 | IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS |
| | 601 | Calibration |
| | 602 | With auxiliary means to condition stimulus/response signals |
| | 603 | For excitation |
| | 605 | For response signal evaluation or processing |
| | 606 | Including a signal comparison circuit |
| | 607 | Including a conversion (e.g., A->D or D-> A) process |
| | 608 | Including a ratiometric function |
| | 609 | For sensing |
| | 612 | Parameter related to the reproduction or fidelity of a signal affected by a circuit under test |
| | 613 | Noise |
| | 615 | Transfer function type characteristics |
| | 616 | Gain or attenuation |
| | 617 | Response time or phase delay |
| | 618 | Transient response or transient recovery time (e.g., damping) |
| | 619 | Selective type characteristics |
| | 620 | Distortion |
| | 621 | Envelope delay |
| | 622 | Phase |
| | 623 | Harmonic |
| | 624 | Intermodulation |
| | 625 | Dissymmetry or asymmetry |
| | 626 | Nonlinearity |
| | 627 | Shielding effectiveness (SE) |
| | 629 | Distributive type parameters |
| | 630 | Plural diverse parameters |
| | 631 | Using wave polarization (e.g., field rotation) |
| | 632 | Using particular field coupling type (e.g., fringing field) |
| | 633 | Using resonant frequency |
| | 634 | To determine water content |
| | 635 | To determine dimension (e.g., distance or thickness) |
| | 636 | With a resonant cavity |
| | 637 | Using transmitted or reflected microwaves |
| | 638 | Scattering type parameters (e.g., complex reflection coefficient) |
| | 639 | Where energy is transmitted through a test substance |
| | 642 | Where energy is reflected (e.g., reflectometry) |
| | 647 | Using a comparison or difference circuit |
| | 649 | Lumped type parameters |
| | 650 | Using phasor or vector analysis |
| | 652 | Of a resonant circuit |
| | 653 | For figure of merit or Q value |
| | 654 | Using inductive type measurement |
| | 658 | Using capacitive type measurement |
| | 659 | With loss characteristic evaluation |
| | 660 | With variable electrode area |
| | 661 | With variable distance between capacitor electrodes |
| | 663 | Where a material or object forms part of the dielectric being measured |
| | 664 | To determine water content |
| | 665 |  By comparison or difference circuit |
| | 667 | By frequency signal response, change or processing circuit |
| | 669 | With compensation means |
| | 671 | To determine dimension (e.g., dielectric thickness) |
| | 672 | By comparison or difference circuit |
| | 674 | By frequency signal response, change or processing circuit |
| | 676 | With pulse signal processing circuit |
| | 679 | With comparison or difference circuit |
| | 681 | With frequency signal response, change or processing circuit |
| | 683 | With phase signal processing circuit |
| | 684 | With compensation means |
| | 686 | With a capacitive sensing means |
| | 691 | Using resistance or conductance measurement |
| | 692 | With living organism condition determination using conductivity effects |
| | 693 | With object or substance characteristic determination using conductivity effects |
| | 694 | To determine water content |
| | 697 | For interface |
| | 698 | To determine oil qualities |
| | 699 | To determine dimension (e.g., distance or thickness) |
| | 701 | Where the object moves while under test |
| | 702 | With radiant energy effects |
| | 704 | With ratio determination |
| | 705 | With comparison or difference circuit |
| | 707 | With frequency response, change or processing circuit |
| | 709 | With phase signal processing circuit |
| | 710 | With pulse signal processing circuit |
| | 713 | With voltage or current signal evaluation |
